About the Conference

A new international industry-focused summit that brings together academic researchers and industry technology leaders to share their vision and thought-leadership on the toughest Reliability, Availability and Serviceability (RAS) challenges facing the automotive market now and in the future. Emphasizing end-use and market ready solutions, RAS in Automotive is sponsored by the IEEE Computer Society in coordination with the Test Technology Technical Community (TTTC).

For this first inaugural edition of the summit, in addition to Keynotes, Panels and Invited Tutorials, the event will also feature demos from the industry, as well as presentations in the area of automotive RAS.

As space is limited, registration will be made available on a rolling basis by invitation only. If you’re interested in attending, please join the waitlist. If you will need a Visa letter to attend, contact Carmen Saliba ([email protected]) with your request.