Preliminary Technical Program

Thursday 5 December                           

8:00 – 9:00         Registration and breakfast                                     

9:00 – 9:40         Opening Session                                                   

                  Steering Co-Chair             Jyotika Athavale                IEEE Computer Society President              

                  Steering Co-Chair             Yervant Zorian                   Synopsys             

                  General Co-Chair              Stefano Di Carlo                Politecnico di Torino   

                  Program Co-Chair             Paolo Bernardi                  Politecnico di Torino   

9:40 – 10:20      Keynote 1              Pete Harrod                      Retired – ARM founder

                  Moderator:                             Matteo Sonza Reorda   Politecnico di Torino   

10:20 – 11:00    Coffee break + Posters                                        

Poster 1 – Toward Flexible and Reliable Automotive SoCs: The Role of Chiplet and UCIe Standardization
Ericles SOUSA (Cadence – UCIe)              

Poster 2 – Fault Tolerance and Self-Healing Mechanism with Memory RAS Capabilities in Automotive Subsystems      
Ravi Kumar SIADRI, Sagar PAWAR, Pir OVAIS (Microsoft Corporation)      

11:00 – 12:00   Invited Talks 1    Silicon Lifecycle Management

Moderator: Hans-Joachim Wunderlich                   Stuttgart University                                   

Speakers:

                                   Yervant Zorian                                                       Synopsys

                                    Daniel Tille                                                               Siemens EDA

                                    Juergen Alt                                                                Infineon Technologies

12:00 – 13:30    lunch                              

13:30 – 14:10   Keynote 2              Phil Koopman   Carnegie Mellon University          

                    Moderator: Wim Dobbeleare                                          onsemi

14:10 – 15:10   Invited Talks 2    Functional Safety Standards

                    Moderator: Sybille Hellebrand                                      Paderborn University                              

Speakers:

                  Jyotika Athavale and Wei-Ren Chen                         Synposys and Tenstorrent

                 Bala Chavali and Ericles SOUSA                                   AMD and Cadence – UCIe

                 Giuseppe Capodanno                                                     Intel

15:10 – 15:50    coffee break                               

15:50 – 17:10   Invited Talks 3    Automotive RAS Visionary talks              

                    Moderator: Cecilia Metra                                            University of Bologna                                  

                    Speakers:

                                          Francesco Rossi                                           Resiltech

                                          Axel Deicke                                                   Consultant

                                          Antonino Armato                                        Bosch

                                          Avi Braun                                                      Synopsys

17:10 – 17:20    short break                                 

17:20 – 18:00   Keynote 3              Ramesh S            General Motors

                    Moderator: Jyotika Athavale                                           IEEE Computer Society President

20:00   Gala Dinner                                

Friday 6 December                                 

8:00 – 8:30         breakfast                                     

8:30 – 9:50         Technical Session 1        
Analog, Mixed-Signal and Technology-oriented Test and Reliability strategies

                    Moderator: Wei-Ren Chen                                                Tenstorrent                           

Dependability Risks due to Faults and Aging Affecting Microprocessors’ Fully Integrated Voltage Regulators                
Martin OMANA (University of Bologna), Alex MENGHI (Hera Group), Alessandro STEFANI (Zivan SRL), Enrico VICINI (Micron Technology), Cecilia METRA (University of Bologna), Giuseppe FROIO (Marvell Technology), Stefano PETRUCCI (Intel Corp.)

Testing of a Bandgap Circuit using Analog Scan              
Wim DOBBELAERE, Anthony COYETTE, Doina DIMA (onsemi), Stephen SUNTER, Krzysztof JURGA (Siemens EDA)

Silicon Data Analytics from In-field Measurements for Extended Lifetimes and Improved Reliability       
Lorin KENNEDY, Jyotika ATHAVALE, Dan ALEXANDRESCU (Synopsys, Inc.)

Low Cost Error Control for Streaming Data in Automotive Systems
Somayeh SADEGHI KOHAN (Paderborn University), Sybille HELLEBRAND (University of Paderborn), Hans-Joachim WUNDERLICH (Universitat Stuttgart)

9:50 – 10:20      coffee break                               

10:20 – 11:40   Technical Session 2        

Solutions for digital circuits Testing and Reliability

                    Moderator: Juergen Alt                                                        Infineon Techologies                      

BIST Based Detection and Reconfiguration Strategy for Fail-Operational Multicore Microcontrollers
Matteo NALDI, Martin Eugenio OMANA, Cecilia METRA (University of Bologna), Ivano SHIVANANDA TROJA (STMicroelectronics), Vivek SHARMA (STMicroelectronics Pvt. Ltd.)

Robust Logic Built-In Self-Test for Automotive Electronics under PVT Variations   
Hanieh JAFARZADEH (University of Stuttgart), Sybille HELLEBRAND (University of Paderborn), Hans-Joachim WUNDERLICH (Universitat Stuttgart)

Early Reliability Estimation in Automotive Systems     
Dinesh Cyril SELVARAJ, Shailesh Sudhakara HEGDE, Josie RODRIGUEZ CONDIA, Nicola AMATI, Carla fabiana CHIASSERINI, Francesco Paolo DE FLORIO, Matteo SONZA REORDA (Politecnico di Torino)

Intelligent Electric Power Steering: Artificial Intelligence Integration Enhances Vehicle Safety and Performance              
Vikas VYAS (Mercedes Benz Research and Developemnt NA), Sneha Sudhir SHETIYA (IEEE)

11:40 – 11:50    short break                                 

11:50 – 12:30   Invited Talks 4    Automotive RAS Visionary talks

                    Moderator: Annachiara Ruospo                                   Politecnico di Torino                     

                    Speakers: Thomas Zettler                                              Infineon Technologies

                                      Michele De Tomasi                                       STMicroelectronics

12:30 – 13:30    lunch                              

13:30 – 14:30   panel     ATE Vision 20240

Organizer and moderator: Davide Appello             Technoprobe

                     Panelists:                               

                                    Giuseppe Amelio                                                 Microtest

                                    Fabio Marino                                                        Advantest

                                    Emanuele Bardo                                                 Spea

                                    Thomas Koehler                                                 Teradyne

                                    Claudia Bertani                                                   STMicroelectronics

14:30 – 15:10   Keynote 4              François Guichard         United Nations Economic Commission for Europe

                         Moderator: Paolo Bernardi                                               Politecnico di Torino

15:10      closing remarks